High performance of AlGaN deep-ultraviolet light emitting diodes due to improved vertical carrier transport by delta-accelerating quantum barriers

被引:33
作者
Lang, J. [1 ]
Xu, F. J. [1 ]
Ge, W. K. [1 ]
Liu, B. Y. [1 ]
Zhang, N. [1 ]
Sun, Y. H. [1 ]
Wang, M. X. [1 ]
Xie, N. [1 ]
Fang, X. Z. [1 ]
Kang, X. N. [1 ]
Qin, Z. X. [1 ]
Yang, X. L. [1 ]
Wang, X. Q. [1 ,2 ]
Shen, B. [1 ,2 ]
机构
[1] Peking Univ, Sch Phys, State Key Lab Artificial Microstruct & Mesoscop P, Beijing 100871, Peoples R China
[2] Collaborat Innovat Ctr Quantum Matter, Beijing 100871, Peoples R China
基金
国家重点研发计划; 中国国家自然科学基金;
关键词
Aluminum gallium nitride;
D O I
10.1063/1.5093160
中图分类号
O59 [应用物理学];
学科分类号
摘要
AlGaN-based deep-ultraviolet light emitting diodes adopting an embedded delta-AlGaN thin layer with an Al composition higher than that in conventional barriers have been investigated. The experimental result shows that when the current is below 250 mA, the maximum of the external quantum efficiency and light output power for the proposed structure reach severally 1.38% and 10.1 mW, which are enhanced significantly by 160% and 197%, respectively, compared to the conventional ones, showing a tremendous improvement. We attribute that to the inserted delta-thin layer's modulation effect on the energy band, namely, accelerating holes to cross the high barrier with very large kinetic energy, thus increasing the hole injection into the active regions. Meanwhile, the electron concentration within the active regions is enhanced as well because of the accompanying additional effect of the delta-AlGaN thin layer being an electron barrier to block electrons escaping from the active region. Published under license by AIP Publishing.
引用
收藏
页数:5
相关论文
共 18 条
[1]   Performance improvement of AlGaN-based deep-ultraviolet light-emitting diodes by inserting single spike barriers [J].
Guo, Weiwei ;
Xu, Fujun ;
Sun, Yuanhao ;
Lu, Lin ;
Qin, Zhixin ;
Yu, Tongjun ;
Wang, Xinqiang ;
Shen, Bo .
SUPERLATTICES AND MICROSTRUCTURES, 2016, 100 :941-946
[2]   Recent progress and future prospects of AlGaN-based high-efficiency deep-ultraviolet light-emitting diodes [J].
Hirayama, Hideki ;
Maeda, Noritoshi ;
Fujikawa, Sachie ;
Toyoda, Shiro ;
Kamata, Norihiko .
JAPANESE JOURNAL OF APPLIED PHYSICS, 2014, 53 (10)
[3]   Enhanced vertical transport in p-type AlGaN/GaN superlattices [J].
Kauser, MZ ;
Osinsky, A ;
Dabiran, AM ;
Chow, PP .
APPLIED PHYSICS LETTERS, 2004, 85 (22) :5275-5277
[4]  
Kneissl M, 2016, SPRINGER SER MATER S, V227, P1, DOI 10.1007/978-3-319-24100-5_1
[5]   Polarization-enhanced Mg doping of AlGaN/GaN superlattices [J].
Kozodoy, P ;
Smorchkova, YP ;
Hansen, M ;
Xing, HL ;
DenBaars, SP ;
Mishra, UK ;
Saxler, AW ;
Perrin, R ;
Mitchel, WC .
APPLIED PHYSICS LETTERS, 1999, 75 (16) :2444-2446
[6]   Simultaneous enhancement of electron overflow reduction and hole injection promotion by tailoring the last quantum barrier in InGaN/GaN light-emitting diodes [J].
Kyaw, Zabu ;
Zhang, Zi-Hui ;
Liu, Wei ;
Tan, Swee Tiam ;
Ju, Zhen Gang ;
Zhang, Xue Liang ;
Ji, Yun ;
Hasanov, Namig ;
Zhu, Binbin ;
Lu, Shunpeng ;
Zhang, Yiping ;
Teng, Jing Hua ;
Wei, Sun Xiao ;
Demir, Hilmi Volkan .
APPLIED PHYSICS LETTERS, 2014, 104 (16)
[7]   AlGaN photonics: recent advances in materials and ultraviolet devices [J].
Li, Dabing ;
Jiang, Ke ;
Sun, Xiaojuan ;
Guo, Chunlei .
ADVANCES IN OPTICS AND PHOTONICS, 2018, 10 (01) :43-110
[8]   Recent progress of high efficiency white LEDs [J].
Narukawa, Yukio ;
Narita, Junya ;
Sakamoto, Takahiko ;
Yamada, Takao ;
Narimatsu, Hiroki ;
Sano, Masahiko ;
Mukai, Takashi .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2007, 204 (06) :2087-2093
[9]   Electron leakage effects on GaN-based light-emitting diodes [J].
Piprek, Joachim ;
Li, Simon .
OPTICAL AND QUANTUM ELECTRONICS, 2010, 42 (02) :89-95
[10]   Deep-ultraviolet light-emitting diodes with external quantum efficiency higher than 20% at 275 nm achieved by improving light-extraction efficiency [J].
Takano, Takayoshi ;
Mino, Takuya ;
Sakai, Jun ;
Noguchi, Norimichi ;
Tsubaki, Kenji ;
Hirayama, Hideki .
APPLIED PHYSICS EXPRESS, 2017, 10 (03)