High-Amplitude versus Low-Amplitude Current Oscillations during the Anodic Oxidation of p-Type Silicon in Fluoride Containing Electrolytes

被引:17
作者
Schoenleber, Konrad [1 ]
Krischer, Katharina [1 ]
机构
[1] Tech Univ Munich, Dept Phys, D-85748 Garching, Germany
关键词
ellipsometry; reaction valency; electrochemistry; semiconductors; silicon; ELECTROCHEMICAL OSCILLATIONS; DISSOLUTION; SI; INTERFACE; MODEL; ORIGIN; OXIDE;
D O I
10.1002/cphc.201200230
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Sustained electrochemical oscillations at p-type Si(100) in a dilute ammonium fluoride electrolyte are investigated by means of ellipsometric intensity and hydrogen measurements. Two main types of oscillations are identified, one with a low and one with a high current amplitude. It is demonstrated that the low-current amplitude oscillations do not involve any variations in oxide quality or etch rate. Furthermore, experimental results suggest that the high-amplitude current oscillations emerge from the low-amplitude current oscillations and thus share the feedback loops causing the oscillatory instability. Hence, the origin of oscillations during anodic dissolution of silicon has to be reconsidered.
引用
收藏
页码:2989 / 2996
页数:8
相关论文
共 26 条
[1]   INTERFACE CONDITION OF N-SI(111) DURING PHOTOCURRENT OSCILLATIONS IN NH4F SOLUTIONS [J].
AGGOUR, M ;
GIERSIG, M ;
LEWERENZ, HJ .
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1995, 383 (1-2) :67-74
[2]  
[Anonymous], THESIS TU MUNCHEN
[3]   ELECTROCHEMICAL AND OPTICAL STUDIES OF SILICON DISSOLUTION IN AMMONIUM FLUORIDE SOLUTIONS [J].
BLACKWOOD, DJ ;
BORAZIO, A ;
GREEF, R ;
PETER, LM ;
STUMPER, J .
ELECTROCHIMICA ACTA, 1992, 37 (05) :889-896
[4]   Ellipsometric and microwave reflectivity studies of current oscillations during anodic dissolution of p-Si in fluoride solutions [J].
Böhm, S ;
Peter, LM ;
Schlichthörl, G ;
Greef, R .
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 2001, 500 (1-2) :178-184
[5]   A model for current oscillations in the Si-HF system based on a quantitative analysis of current transients [J].
Carstensen, J ;
Prange, R ;
Popkirov, GS ;
Foll, H .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 67 (04) :459-467
[6]   Electrodissolution of p-Si in acidic fluoride media - Modeling of the steady state [J].
Cattarin, S ;
Frateur, I ;
Musiani, M ;
Tribollet, B .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2000, 147 (09) :3277-3282
[7]   Anodic silicon dissolution in acidic fluoride electrolyte. A probe beam deflection investigation [J].
Cattarin, S ;
Decker, F ;
Dini, D .
JOURNAL OF PHYSICAL CHEMISTRY B, 1998, 102 (24) :4779-4784
[8]   THE P-SI FLUORIDE INTERFACE IN THE ANODIC REGION - DAMPED AND OR SUSTAINED OSCILLATIONS [J].
CHAZALVIEL, JN ;
OZANAM, F ;
ETMAN, M ;
PAOLUCCI, F ;
PETER, LM ;
STUMPER, J .
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1992, 327 (1-2) :343-349
[9]   In situ infrared study of the oscillating anodic dissolution of silicon in fluoride electrolytes [J].
Chazalviel, JN ;
da Fonseca, C ;
Ozanam, F .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1998, 145 (03) :964-973
[10]   IONIC PROCESSES THROUGH THE INTERFACIAL OXIDE IN THE ANODIC-DISSOLUTION OF SILICON [J].
CHAZALVIEL, JN .
ELECTROCHIMICA ACTA, 1992, 37 (05) :865-875