Atomic-force microscopy and photoluminescence of nanostructured CdTe

被引:0
|
作者
Babentsov, V. [1 ]
Sizov, F. [1 ]
Franc, J. [2 ]
Luchenko, A. [1 ]
Svezhentsova, E. [1 ]
Tsybrii, Z. [1 ]
机构
[1] Natl Acad Sci Ukraine, Lashkaryov Inst Semicond Phys, UA-03028 Kiev, Ukraine
[2] Charles Univ Prague, Fac Math & Phys, Inst Phys, CZ-12116 Prague, Czech Republic
关键词
SOLAR-CELLS; 1ST-PRINCIPLES CALCULATION; QUANTUM DOTS; DEFECTS; SEMICONDUCTORS; LUMINESCENCE; ZINCBLENDE; DEVICES; FILMS;
D O I
10.1134/S1063782613090030
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Low-dimensional CdTe nanorods with a diameter of 10-30 nm and a high aspect ratio that reaches 100 are studied. The nanorods are grown by the physical vapor transport method with the use of Bi precipitates on the substrates. In addition, thin films of closely packed CdTe nanorods with the transverse dimensions similar to(100-200) nm are grown. Atomic-force microscopy shows that the cross sections of all of the nanorods were hexagonally shaped. By photoluminescence measurements, the inference about the wurtzite structure of CdTe is supported, and the structural quality, electron-phonon coupling, and defects are analyzed. On the basis of recent ab initio calculations, the nature of defects responsible for the formation of deep levels in the CdTe layers and bulk crystals are analyzed.
引用
收藏
页码:1198 / 1202
页数:5
相关论文
共 50 条
  • [1] Atomic-force microscopy and photoluminescence of nanostructured CdTe
    V. Babentsov
    F. Sizov
    J. Franc
    A. Luchenko
    E. Svezhentsova
    Z. Tsybrii
    Semiconductors, 2013, 47 : 1198 - 1202
  • [2] ATOMIC-FORCE MICROSCOPY
    BINNIG, GK
    PHYSICA SCRIPTA, 1987, T19A : 53 - 54
  • [3] ATOMIC-FORCE MICROSCOPY
    BLANCHARD, CR
    CAMPBELL, JB
    ADVANCED MATERIALS & PROCESSES, 1995, 148 (02): : 62 - 62
  • [4] ACOUSTIC MICROSCOPY BY ATOMIC-FORCE MICROSCOPY
    RABE, U
    ARNOLD, W
    APPLIED PHYSICS LETTERS, 1994, 64 (12) : 1493 - 1495
  • [5] Theory of atomic-force microscopy
    Sasaki, N
    Tsukada, M
    SCIENCE REPORTS OF THE RESEARCH INSTITUTES TOHOKU UNIVERSITY SERIES A-PHYSICS CHEMISTRY AND METALLURGY, 1997, 44 (01): : 1 - 15
  • [6] DIRECT OBSERVATION OF THE ATOMIC-FORCE MICROSCOPY TIP USING INVERSE ATOMIC-FORCE MICROSCOPY IMAGING
    MONTELIUS, L
    TEGENFELDT, JO
    VANHEEREN, P
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03): : 2222 - 2226
  • [7] ATOMIC-FORCE MICROSCOPY OF THE CORNEA AND SCLERA
    FULLWOOD, NJ
    HAMMICHE, A
    POLLOCK, HM
    HOURSTON, DJ
    SONG, M
    CURRENT EYE RESEARCH, 1995, 14 (07) : 529 - 535
  • [8] ATOMIC-FORCE MICROSCOPY OF PLANT CHROMOSOMES
    WINFIELD, M
    MCMASTER, TJ
    KARP, A
    MILES, MJ
    CHROMOSOME RESEARCH, 1995, 3 (02) : 128 - 131
  • [9] ATOMIC-FORCE MICROSCOPY OF LIVING CELLS
    HENDERSON, E
    PARPURA, V
    SAKAGUCHI, D
    HAYDON, P
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1993, 206 : 253 - POLY
  • [10] ATOMIC-FORCE MICROSCOPY OF NEURON NETWORKS
    CRICENTI, A
    DE STASIO, G
    GENEROSI, R
    PERFETTI, P
    CIOTTI, MT
    MERCANTI, D
    SCANNING MICROSCOPY, 1995, 9 (03) : 695 - 700