A HIGH-SPEED REVERSIBLE LOW-POWER ERROR TOLERANT ADDER

被引:0
作者
Raheem, M. A. [1 ]
Gupta, Harsh [2 ]
Fatima, Kaleem [1 ]
Adil, Osman [1 ]
机构
[1] Muffakham Jah Coll Engn & Technol, ECE Dept, Hyderabad, Andhra Pradesh, India
[2] ICFAI Univ, Hyderabad, Andhra Pradesh, India
来源
2012 ASIA PACIFIC CONFERENCE ON POSTGRADUATE RESEARCH IN MICROELECTRONICS & ELECTRONICS (PRIMEASIA) | 2012年
关键词
Error Tolerance; Reversible Logic; Quantum Cost; Accuracy; High Speed Circuits; Low Power Design; Garbage Outputs; DESIGN;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new reversible Error Tolerant Adder (ETA) based on the reversible Logic is proposed. RH and RS gates are the novel reversible logic gates based on which the ETA is designed. The reversible 3x3 RH gate is derived from existing 2x2 quantum gates - CNOT, Controlled-V and Controlled-V+. The reversible 3x3 RS gate consists of the existing CNOT and Peres Quantum gates. The design of the proposed reversible ETA demonstrates better power delay product (PDP) than the existing ETA's in terms of quantum cost and delay, while maintaining the minimum number of garbage outputs. In comparison with other ETAs, the current design offers a PDP improvement of 54.06%.
引用
收藏
页码:178 / 183
页数:6
相关论文
共 13 条
[1]  
Breuer Melvin A., 2006, P 2006 INT C INT INF
[2]  
Breuer Melvin A., 2005, P IEEE COMP SOC ANN
[3]  
Chong I. S., 2005, DEF FAULT TOL VLSI S
[4]  
Lee K.-J., 2005, Intl. Test Conf, P1136
[5]   HIGH-SPEED ARITHMETIC IN BINARY COMPUTERS [J].
MACSORLEY, O .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1961, 49 (01) :67-&
[6]  
Mitra S. K., 2012, Proceedings of the 25th International Conference on VLSI Design. VLSI Design 2012. Held jointly with 11th International Conference on Embedded Systems, P334, DOI 10.1109/VLSID.2012.93
[7]  
RAJMOHAN V, 2011, INT J COMPUTER THEOR, V3, P697
[8]  
Rangaraju H. G., 2010, J EMERGING TECHNOLOG, V1, P1
[9]  
Syamala Y., 2011, 2011 3rd International Conference on Electronics Computer Technology (ICECT 2011), P207, DOI 10.1109/ICECTECH.2011.5941987
[10]  
Thapliyal H., 2011, 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO), P1430, DOI 10.1109/NANO.2011.6144350