Fast defect inspection of high-resolution and textured cylindrical lens holder surface using randomized SVD

被引:3
作者
Chen, Ssu-Han [1 ]
机构
[1] Ming Chi Univ Technol, Dept Ind Engn & Management, New Taipei City, Taiwan
关键词
Machine vision; lens holder; directional texture; RSVD-based image restoration scheme; SINGULAR-VALUE DECOMPOSITION; DIRECTIONAL TEXTURES; VISUAL INSPECTION; SYSTEM; DESIGN;
D O I
10.1080/10589759.2016.1139705
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
This paper describes an automatic inspection system for detecting defects on the cylindrical surface of lens holders using machine vision. The system is composed of a charge coupled device, a coaxial light and a motor unit. A sequence of partial surface images of a lens holder is grabbed and is reconstructed into a two-dimensional unwrapped image. Then, a series of image processes is used to normalise, segment and detect the defects. Freedom of orientation is one of the advantages of the system, since it permits users to place a to-be-inspected lens holder on the fixture at an arbitrary orientation. Furthermore, a novel global image restoration scheme, based on randomised singular value decomposition, is proposed in this study, in order to quickly detect defects embedded in the high-resolution surface.
引用
收藏
页码:59 / 78
页数:20
相关论文
共 32 条
[11]   Finding Structure with Randomness: Probabilistic Algorithms for Constructing Approximate Matrix Decompositions [J].
Halko, N. ;
Martinsson, P. G. ;
Tropp, J. A. .
SIAM REVIEW, 2011, 53 (02) :217-288
[12]   Non-contact measurement of damaged external tapered thread based on linear array CCD [J].
He, F. J. ;
Zhang, R. J. ;
Du, Z. J. ;
Cui, X. M. .
4TH INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION SCIENCE AND TECHNOLOGY (ISIST' 2006), 2006, 48 :676-680
[13]   Improved illumination for vision-based defect inspection of highly reflective metal surface [J].
Li, Lin ;
Wang, Zhong ;
Pei, Fangying ;
Wang, Xiangjun .
CHINESE OPTICS LETTERS, 2013, 11 (02)
[14]   Automatic defect inspection for LCDs using singular value decomposition [J].
Lu, CJ ;
Tsai, DM .
INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2005, 25 (1-2) :53-61
[15]   Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition [J].
Lu, CJ ;
Tsai, DM .
INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, 2004, 42 (20) :4331-4351
[16]   A SURVEY OF AUTOMATED VISUAL INSPECTION [J].
NEWMAN, TS ;
JAIN, AK .
COMPUTER VISION AND IMAGE UNDERSTANDING, 1995, 61 (02) :231-262
[17]  
Oh J, 2005, AI 2004 ADV ARTIFICI, P967
[18]  
Pande S, 2012, INT J COMPUT APPL, V44, P33, DOI DOI 10.5120/6294-8491
[19]   Design and development of a new machine vision wire bonding inspection system [J].
Perng, Der-Baau ;
Chou, Cheng-Chuan ;
Lee, Shu-Ming .
INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2007, 34 (3-4) :323-334
[20]   Directional textures auto-inspection using discrete cosine transform [J].
Perng, Der-Baau ;
Chen, Ssu-Han .
INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, 2011, 49 (23) :7171-7187