Time-Wavelength Reflectance Maps of Photonic Crystal Waveguides: A New View on Disorder-Induced Scattering

被引:41
作者
Parini, Alberto [1 ]
Hamel, Philippe [2 ]
De Rossi, Alfredo [3 ]
Combrie, Sylvain [3 ]
Tran, Nguyen-Vi-Quynh [3 ]
Gottesman, Yaneck [1 ]
Gabet, Renaud [2 ]
Talneau, Anne [4 ]
Jaouen, Yves [2 ]
Vadala, Giovanni [3 ,5 ]
机构
[1] TELECOM SudParis, F-91011 Evry, France
[2] TELECOM ParisTech, F-75013 Paris, France
[3] Thales Res & Technol France, F-91767 Palaiseau, France
[4] Lab Photon & Nanostruct, F-91460 Marcoussis, France
[5] Univ Padua, I-35122 Padua, Italy
关键词
Disorder; optical low-coherence reflectometry (OLCR); photonic crystal; slow light;
D O I
10.1109/JLT.2008.2004957
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We investigate the impact of disorder on the propagation of photonic crystal waveguide modes using phase-sensitive optical low-coherence reflectometry. Combined with a suitable numerical processing, this technique reveals a considerable amount of information that we cast as time-wavelength reflectance maps. By comparing measurements on different samples, we easily identify inter-mode scattering and propagation losses mediated by slow leaky modes. We also characterize the dispersive behaviour of point defects. Our results verify previous theoretical predictions about the general group velocity scaling of losses and the dominant role of backscattering.
引用
收藏
页码:3794 / 3802
页数:9
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