Vibration Measurement Using a Fringe Pattern in Reflective Monochromatic Interferometry

被引:2
作者
Kim, Minsu [1 ]
Yoon, Do-Young [1 ]
Pahk, Heuijae [1 ]
机构
[1] Seoul Natl Univ, Sch Mech & Aerosp Engn, Seoul 151742, South Korea
关键词
Interferometry; Vibration measurement; Fringe analysis; LIGHT SCANNING INTERFEROMETRY; PHASE-SHIFTING INTERFEROMETRY; HOLOGRAPHIC-INTERFEROMETRY; MICHELSON INTERFEROMETER; SURFACE MEASUREMENT;
D O I
10.3807/JOSK.2015.19.5.494
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper introduces methods to measure vibration using a fringe pattern. These methods use variations of a fringe pattern in reflective monochromatic interferometry, without additional components. With the proposed methods we measured the vibrations of four waveform with amplitude 100 nm. When the vibrational amplitude is greater than a quarter wavelength of the light employed, however, the measured results are distorted due to ambiguity. Thus we propose advanced methods to solve this problem, and also measure the vibrations of two waveformswith an amplitude of 1 mu m. To verify the performance of the proposed methods, we compare the results to those from an accelerometer. Multifrequency vibrations of 1, 5, 10, and 20 Hz are measured by both techniques, and the results compared in the frequency domain.
引用
收藏
页码:494 / 502
页数:9
相关论文
共 23 条
  • [1] VIBRATION IN PHASE-SHIFTING INTERFEROMETRY
    DEGROOT, PJ
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1995, 12 (02) : 354 - 365
  • [2] Vibration measurement by temporal Fourier analyses of a digital hologram sequence
    Fu, Yu
    Pedrini, Giancarlo
    Osten, Wolfgang
    [J]. APPLIED OPTICS, 2007, 46 (23) : 5719 - 5727
  • [3] PROJECTION MOIRE INTERFEROMETER FOR VIBRATION ANALYSIS
    HARDING, KG
    HARRIS, JS
    [J]. APPLIED OPTICS, 1983, 22 (06): : 856 - 861
  • [4] DIGITAL PHASE-SHIFTING INTERFEROMETRY - A SIMPLE ERROR-COMPENSATING PHASE CALCULATION ALGORITHM
    HARIHARAN, P
    OREB, BF
    EIJU, T
    [J]. APPLIED OPTICS, 1987, 26 (13) : 2504 - 2506
  • [5] Dual Michelson interferometers for distributed vibration detection
    Hong, Xiaobin
    Wu, Jian
    Zuo, Chao
    Liu, Fangsen
    Guo, Hongxiang
    Xu, Kun
    [J]. APPLIED OPTICS, 2011, 50 (22) : 4333 - 4338
  • [6] Measurement of objects with low vibration frequencies using modified Michelson interferometry
    Huang, David Te-Yen
    Yeh, Sheng Lih
    Hsu, Sung Chih
    [J]. JOURNAL OF OPTICS, 2011, 13 (08)
  • [7] Methods to Measure the Critical Dimension of the Bottoms of Through-Silicon Vias Using White-Light Scanning Interferometry
    Hyun, Changhong
    Kim, Seongryong
    Pahk, Heuijae
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF KOREA, 2014, 18 (05) : 531 - 537
  • [8] Thickness and Surface Measurement of Transparent Thin-Film Layers using White Light Scanning Interferometry Combined with Reflectometry
    Jo, Taeyong
    Kim, KwangRak
    Kim, SeongRyong
    Pahk, HeuiJae
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF KOREA, 2014, 18 (03) : 236 - 243
  • [9] 3D Measurement of TSVs Using Low Numerical Aperture White-Light Scanning Interferometry
    Jo, Taeyong
    Kim, Seongryong
    Pahk, Heuijae
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF KOREA, 2013, 17 (04) : 317 - 322
  • [10] VIBRATION MEASUREMENT USING PHASE-SHIFTING SPECKLE-PATTERN INTERFEROMETRY
    NAKADATE, S
    [J]. APPLIED OPTICS, 1986, 25 (22): : 4162 - 4167