Influence of crystal polarity on Mg incorporation in ZnO

被引：12

作者：

Adachi, Yutaka ^{[1
]}

Ohashi, Naoki ^{[1
,2
]}

Sakaguchi, Isao ^{[3
]}

Haneda, Hajime ^{[4
]}

机构：

[1] Natl Inst Mat Sci, Opt & Elect Mat Unit, Optoelect Mat Grp, Tsukuba, Ibaraki 3050044, Japan

[2] NIMS, NIMS St Gobain Res Ctr Excellence Adv Mat, Tsukuba, Ibaraki 3050047, Japan

[3] Natl Inst Mat Sci, Opt & Elect Mat Unit, Ceram Chem Grp, Tsukuba, Ibaraki 3050044, Japan

[4] NIMS Open Innovat Ctr, Tsukuba, Ibaraki 3050044, Japan

来源：

PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2013年 / 250卷 / 10期

关键词：

incorporation efficiency; photoluminescence; polarity; pulsed laser deposition; sticking coefficient; PULSED-LASER DEPOSITION; FILMS; MGXZN1-XO; SAPPHIRE; SURFACES; ALLOY;

D O I：

10.1002/pssb.201200985

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

In this study, we investigated the influence of polarity on Mg incorporation in ZnO films grown using pulsed laser deposition. The photoluminescence (PL) measurements of (Zn,Mg)O films grown on the c(+) and c(-) faces of ZnO revealed that the peak position of the near-band-edge emission for the films on the c(-)-face was at a shorter wavelength than that for the films on the c(+)-face. This result indicates that the Mg content in the films on the c(-)-face is higher than that for the films on the c(+)-face regardless of the same growth conditions used, except for the polarity of the substrates. This difference in the Mg content in the c(+)- and c(-)-polar films can result from the difference in the value of the sticking coefficients for Zn atoms on the c(+)- and c(-)-faces. We also demonstrated that polarity determination can be possible by (Zn,Mg)O film deposition followed by PL mapping measurement. (C) 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

引用

页码：2122 / 2125

页数：4

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