Decay of the Ar 2s-1 and 2p-1 and Kr 3p-1 and 3d-1 hole states studied by photoelectron-ion coincidence spectroscopy -: art. no. 042708

被引:57
作者
Brünken, S
Gerth, C
Kanngiesser, B
Luhmann, T
Richter, M
Zimmermann, P
机构
[1] Tech Univ Berlin, Inst Atomare Phys & Fachdidakt, D-10623 Berlin, Germany
[2] BESSY, PTB, D-12489 Berlin, Germany
来源
PHYSICAL REVIEW A | 2002年 / 65卷 / 04期
关键词
D O I
10.1103/PhysRevA.65.042708
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The decay channels of the Ar 2s(-1) and 2p(-1) and Kr 3p(-1) and 3d(-1) electronic hole states have been investigated by means of photoelectron-photoion coincidence measurements following innershell ionization using synchrotron radiation. With the method of final ion-charge resolving electron spectroscopy it has become possible to disentangle different contributions to the electron spectrum and to determine the decay probabilities P(nl(-1)-->n+) of the above-mentioned hole states (nl(-1)) to the final ionic charge states n+. A high correlation with threefold or even fourfold charged ions has been found in all cases. Possible decay routes, via cascade or direct double Auger processes, are discussed on the basis of energy-level schemes calculated with the Hartree-Fock method. Special emphasis is laid on the examination of the Kr 3p(-1) decay process, where the two fine-structure components (j=1/2,3/2) exhibit noticeably different decay probabilities to Kr3+ and Kr4+ final ionic charge states.
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页数:7
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