Imaging of Graphene with Confocal Raman and Atomic Force Microscopy

被引：0
|
作者：
机构：
[1] WITec GmbH, D-89081 Ulm, Germany
来源：
SPECTROSCOPY | 2013年
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D O I：
暂无
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
The characterization of graphene with combined Raman-AFM imaging provides a nondestructive method to extensively investigate its properties.
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页码：25 / 25
页数：1
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