Evanescent-wave-induced frequency shift for optical superresolution imaging

被引:34
|
作者
Hao, Xiang [1 ]
Kuang, Cuifang [1 ]
Li, Yanghui [2 ]
Liu, Xu [1 ]
机构
[1] Zhejiang Univ, State Key Lab Modern Opt Instrumentat, Hangzhou 310027, Zhejiang, Peoples R China
[2] China Jiliang Univ, Coll Opt & Elect Technol, Hangzhou 310018, Zhejiang, Peoples R China
基金
中国国家自然科学基金;
关键词
STRUCTURED-ILLUMINATION MICROSCOPY; LATERAL RESOLUTION; LIMIT;
D O I
10.1364/OL.38.002455
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We propose a method to enhance the resolution and break the diffraction limit. The superresolution imaging is realized by incorporating total internal reflection (TIR) illumination with a passive spatial frequency shift mechanism. Meanwhile, TIR supplies a surface field with a limited penetration depth, which demonstrates that the axial resolution can be improved simultaneously. The superresolution capability is confirmed both theoretically and experimentally. Compared with microfiber-based former work, this idea possesses promising merits, providing a wider viewing field and a simpler configuration for variable illumination orientations, thereby implying abundant application potentials. (c) 2013 Optical Society of America
引用
收藏
页码:2455 / 2458
页数:4
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