Evanescent-wave-induced frequency shift for optical superresolution imaging

被引：34

作者：

Hao, Xiang ^{[1
]}

Kuang, Cuifang ^{[1
]}

Li, Yanghui ^{[2
]}

Liu, Xu ^{[1
]}

机构：

[1] Zhejiang Univ, State Key Lab Modern Opt Instrumentat, Hangzhou 310027, Zhejiang, Peoples R China

[2] China Jiliang Univ, Coll Opt & Elect Technol, Hangzhou 310018, Zhejiang, Peoples R China

来源：

OPTICS LETTERS | 2013年 / 38卷 / 14期

基金：

中国国家自然科学基金;

关键词：

STRUCTURED-ILLUMINATION MICROSCOPY; LATERAL RESOLUTION; LIMIT;

D O I：

10.1364/OL.38.002455

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We propose a method to enhance the resolution and break the diffraction limit. The superresolution imaging is realized by incorporating total internal reflection (TIR) illumination with a passive spatial frequency shift mechanism. Meanwhile, TIR supplies a surface field with a limited penetration depth, which demonstrates that the axial resolution can be improved simultaneously. The superresolution capability is confirmed both theoretically and experimentally. Compared with microfiber-based former work, this idea possesses promising merits, providing a wider viewing field and a simpler configuration for variable illumination orientations, thereby implying abundant application potentials. (c) 2013 Optical Society of America

引用

页码：2455 / 2458

页数：4

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