共 14 条
[1]
Bo D., 2004, IEEE T INSTRUMENTATI, V53, P1526
[2]
Chen HJ, 2005, 2005 International Conference on Control and Automation (ICCA), Vols 1 and 2, P977
[3]
Cook G. E., 1995, 1995 IEEE IND APPL C, V2, P1809
[5]
DAR IM, 1995, AUTOTESTCON '95 - SYSTEMS READINESS: TEST TECHNOLOGY FOR THE 21ST CENTURY, CONFERENCE RECORD, P376, DOI 10.1109/AUTEST.1995.522699
[6]
Ewald H, 2003, IEEE IMTC P, P1309
[8]
Predoi MV, 1997, 1997 IEEE ULTRASONICS SYMPOSIUM PROCEEDINGS, VOLS 1 & 2, P845, DOI 10.1109/ULTSYM.1997.663145