Calibration of a vertical-scan long trace profiler at MSFC

被引：14
|
作者：
Gubarev, M [1 ]
Kester, T [1 ]
Takacs, PZ [1 ]
机构：
[1] NASA, George C Marshall Space Flight Ctr, Huntsville, AL 35812 USA
来源：
OPTICAL MANUFACTURING AND TESTING IV | 2001年 / 4451卷
关键词：
long trace profiler; calibration; accuracy; systematic error;
D O I：
10.1117/12.453648
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The long trace profiler (LTP) is the instrument of choice for the surface figure measurement of grazing incidence mirrors. The modification of conventional LTP, the vertical-scan LTP, capable of measuring the surface figure of replicated shell mirrors is now in operation at Marshall Space Flight Center. A few sources of systematic error for vertical scan LTP are discussed. Status of systematic error reduction is reported.
引用
收藏
页码：333 / 339
页数：7
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