机构:
Chinese Acad Sci, Comp Sci Lab, Inst Software, Beijing 100864, Peoples R ChinaChinese Acad Sci, Comp Sci Lab, Inst Software, Beijing 100864, Peoples R China
Xu, C
[1
]
Zhang, J
论文数: 0引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Comp Sci Lab, Inst Software, Beijing 100864, Peoples R ChinaChinese Acad Sci, Comp Sci Lab, Inst Software, Beijing 100864, Peoples R China
Zhang, J
[1
]
机构:
[1] Chinese Acad Sci, Comp Sci Lab, Inst Software, Beijing 100864, Peoples R China
来源:
COMPUTER SCIENCE AND TECHNOLOGY IN NEW CENTURY
|
2001年
关键词:
EFSM;
test data generation;
recursive functions;
D O I:
暂无
中图分类号:
TP18 [人工智能理论];
学科分类号:
081104 ;
0812 ;
0835 ;
1405 ;
摘要:
Test data generation in program testing is the process of identifying a suite of test data that satisfy a selected criterion, such as statement coverage or branch coverage. Most existing methods for test data generation are limited to unit testing and may not work for programs with functions. In [1] we present an approach to automated test data generation for unit testing, which is based on extended finite state machines (EFSMs). In order to deal with programs with functions, we extend our work by improving the EFSM generation process. The new approach can eliminate functions in a C program and convert the program into a whole equivalent EFSM. Now the EFSM generator can accept C programs with functions, and its output can be accepted by the EFSM analyzer described in [1].