Freeform surface measurement and characterisation using a toolmakers microscope

被引：0

作者：

Wong, Francis Seung-yin ^{[1
]}

Chauh, Kong-Bieng ^{[1
]}

Venuvinod, Patri K. ^{[1
]}

机构：

[1] City Univ Hong Kong, Hong Kong, Hong Kong, Peoples R China

来源：

14TH INTERNATIONAL CONFERENCE ON METROLOGY AND PROPERTIES OF ENGINEERING SURFACES (MET & PROPS 2013) | 2014年 / 483卷

关键词：

Freeform surface design; Freeform surface production; Surface inspection; Dimension feature recognition; Toolmakers microscope; Artificial intelligence; MACHINE;

D O I：

10.1088/1742-6596/483/1/012004

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Current freeform surface (FFS) characterization systems mainly cover aspects related to computer-aided design/manufacture (CAD/CAM). This paper describes a new approach that extends into computer-aided inspection (CAI). The following novel features are addressed: Feature recognition and extraction from surface data Characterisation of properties of the surface's M and N vectors at individual vertex Development of a measuring plan using a toolmakers microscope for the inspection of the FFS Inspection of the actual FFS produced by CNC milling Verification of the measurement results and comparison with the CAD design data Tests have shown that the deviations between the CAI and CAD data were within the estimated uncertainty limits.

引用

页数：6

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