A 128-Channel CMOS Charge Readout ASIC for Flat-Panel X-Ray Detectors

被引：10

作者：

Adachi, Susumu ^{[1
]}

Nishimura, Akihiro ^{[1
]}

Yoshimlita, Toshinori ^{[1
]}

Tanabe, Koichi ^{[1
]}

Okamura, Shoichi ^{[1
]}

机构：

[1] Shimadzu Co Ltd, Technol Res Lab, Seika, Kyoto 6190237, Japan

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2008年 / 55卷 / 06期

关键词：

Application specific integrated circuits; CMOS analog integrated circuits; noise measurement; x-ray detectors; x-ray imaging;

D O I：

10.1109/TNS.2008.2005105

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A CMOS charge readout ASIC (SD7110) for flat-panel X-ray detectors was designed and tested. This ASIC contains 128 readout channels, with each channel consisting of a charge sensitive amplifier, a correlated double sampler, and a track-and-hold circuit. Channel outputs are read out via a 128:1 analog multiplexer and fed into an external 16-bit A/D converter. Conversion gain can be selected from 0.25 V/pC to 8 V/pC. The ASIC operates using a +5.0 V single power supply, with power dissipation of 1.8 mW/channel. The equivalent noise charge (ENC) measured was 400 + 18.9 e-/pF.

引用

页码：3673 / 3683

页数：11

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