Diffractive-optical-element-based glossmeter and low coherence interferometer in assessment of local surface quality of paper

被引:11
作者
Peiponen, KE
Alarousu, E
Juuti, M
Silvennoinen, R
Oksman, A
Myllylä, R
Prykäri, T
机构
[1] Univ Joensuu, Dept Phys, FI-80101 Joensuu, Finland
[2] Oulu Univ, Optoelect & Measurement Tech Lab, FI-90014 Oulu, Finland
关键词
glossmeter; low-coherence interferometer; paper; gloss; surface topography; surface roughness;
D O I
10.1117/1.2188963
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The surface microroughness of paper has an important role on its gloss. Unfortunately, commercial glossmeters do not provide information on the local gloss of paper. In this study a low-coherence interferometer was employed for the assessment of the average surface roughness of fine, supercalendered, and Xerox papers by means of recorded topography maps. Furthermore, the local and average gloss were measured by a diffractive-optical-element-based glossmeter. This is the first time that the measurement of the local gloss of paper has been accomplished. The information on both surface roughness and gloss, obtained by the two devices in this study, should help papermakers in their research and development of optimal paper surface quality, which is crucial to optimal ink absorption in printing. (c) 2006 Society of Photo-Optical Instrumentation Engineers.
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页数:7
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