On-chip Monitors of Supply Noise Generated by System-level ESD

被引：0

作者：

Thomson, Nicholas ^{[1
,2
]}

Reiman, Collin ^{[1
]}

Xiu, Yang ^{[1
]}

Rosenbaum, Elyse ^{[1
]}

机构：

[1] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA

[2] Intel Corp, 2501 NE Century Blvd, Hillsboro, OR 97124 USA

来源：

2017 39TH ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM (EOS/ESD) | 2017年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Two supply noise monitor circuits are demonstrated on a 130-nm test chip. These monitors are capable of providing quantitative measurements of on-chip supply voltage perturbations resulting from system-level ESD. Circuit-level simulations reproduce all trends found in the measurement results.

引用

页数：10

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