On-chip Monitors of Supply Noise Generated by System-level ESD

被引：0
|
作者：
Thomson, Nicholas [1 ,2 ]
Reiman, Collin [1 ]
Xiu, Yang [1 ]
Rosenbaum, Elyse [1 ]
机构：
[1] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA
[2] Intel Corp, 2501 NE Century Blvd, Hillsboro, OR 97124 USA
来源：
2017 39TH ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM (EOS/ESD) | 2017年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Two supply noise monitor circuits are demonstrated on a 130-nm test chip. These monitors are capable of providing quantitative measurements of on-chip supply voltage perturbations resulting from system-level ESD. Circuit-level simulations reproduce all trends found in the measurement results.
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页数：10
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