Morphology characterization in organic and hybrid solar cells

被引:377
作者
Chen, Wei [1 ]
Nikiforov, Maxim P. [1 ]
Darling, Seth B. [1 ,2 ]
机构
[1] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA
[2] Univ Chicago, Inst Mol Engn, Chicago, IL 60637 USA
关键词
KELVIN PROBE FORCE; BULK HETEROJUNCTION FILMS; CHARGE-TRANSPORT; THIN-FILMS; PHOTOVOLTAIC BLENDS; MOLECULAR PACKING; PHOTOINDUCED DEGRADATION; NEUTRON REFLECTIVITY; STRUCTURAL EVOLUTION; CONJUGATED POLYMERS;
D O I
10.1039/c2ee22056c
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Organic and hybrid organic-inorganic photovoltaics are among the most promising options for low-cost and highly scalable renewable energy. In order to fully realize the potential of these technologies, power conversion efficiencies and stability will both have to be improved beyond the current state-of-the-art. The morphology of the active layer is of paramount importance in the photon to electron conversion process in organic and hybrid solar cells, with all length scales, from molecular ordering to intradevice composition variability, playing key roles. Given the central influence of morphology, characterizing the structure of these surprisingly complex material systems at multiple length scales is one of the grand challenges in the field. This review addresses the techniques, some of which have only recently been applied to organic and hybrid photovoltaics, available to scientists and engineers working to understand-and ultimately improve-the operation of these fascinating devices.
引用
收藏
页码:8045 / 8074
页数:30
相关论文
共 270 条
  • [1] Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy
    Alexeev, A
    Loos, J
    Koetse, MM
    [J]. ULTRAMICROSCOPY, 2006, 106 (03) : 191 - 199
  • [2] Lifetimes of organic photovoltaics: Design and synthesis of single oligomer molecules in order to study chemical degradation mechanisms
    Alstrup, Jan
    Norrman, Kion
    Jorgensen, Mikkel
    Krebs, Frederik C.
    [J]. SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2006, 90 (17) : 2777 - 2792
  • [3] Applicability of X-ray reflectometry to studies of polymer solar cell degradation
    Andreasen, Jens Wenzel
    Gevorgyan, Suren A.
    Schleputz, Christian M.
    Krebs, Frederik Christian
    [J]. SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2008, 92 (07) : 793 - 798
  • [4] [Anonymous], 1987, Structure Analysis by Small-Angle X-Ray and Neutron Scattering
  • [5] [Anonymous], 2010, REP PROG PHYS
  • [6] Characterization of P3HT/PCBM bulk heterojunction photovoltaic devices using advanced secondary ion mass spectrometry techniques
    Audinot, J. -N.
    Leveque, P.
    Bechara, R.
    Leclerc, N.
    Guillot, J.
    Migeon, H. -N.
    Hadziioannou, G.
    Heiser, T.
    [J]. SURFACE AND INTERFACE ANALYSIS, 2010, 42 (6-7) : 1010 - 1013
  • [7] FitGISAXS: software package for modelling and analysis of GISAXS data using IGOR Pro
    Babonneau, David
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2010, 43 : 929 - 936
  • [8] SPATIAL-MAPPING OF ELECTRICALLY ACTIVE DEFECTS IN HGCDTE USING LASER BEAM-INDUCED CURRENT
    BAJAJ, J
    BUBULAC, LO
    NEWMAN, PR
    TENNANT, WE
    RACCAH, PM
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (05): : 3186 - 3189
  • [9] Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector
    Baker, Jessy L.
    Jimison, Leslie H.
    Mannsfeld, Stefan
    Volkman, Steven
    Yin, Shong
    Subramanian, Vivek
    Salleo, Alberto
    Alivisatos, A. Paul
    Toney, Michael F.
    [J]. LANGMUIR, 2010, 26 (11) : 9146 - 9151
  • [10] The Role of Driving Energy and Delocalized States for Charge Separation in Organic Semiconductors
    Bakulin, Artem A.
    Rao, Akshay
    Pavelyev, Vlad G.
    van Loosdrecht, Paul H. M.
    Pshenichnikov, Maxim S.
    Niedzialek, Dorota
    Cornil, Jerome
    Beljonne, David
    Friend, Richard H.
    [J]. SCIENCE, 2012, 335 (6074) : 1340 - 1344