A high resolution pulsed field ionization photoelectron study of O-2 using third generation undulator synchrotron radiation

被引:33
|
作者
Hsu, CW
Heimann, P
Evans, M
Stimson, S
Fenn, PT
Ng, CY
机构
[1] US DOE,AMES LAB,AMES,IA 50011
[2] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,DIV ACCELERATOR & FUS RES,ADV LIGHT SOURCE,BERKELEY,CA 94720
[3] IOWA STATE UNIV,DEPT CHEM,AMES,IA 50011
[4] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,DIV CHEM SCI,BERKELEY,CA 94720
来源
JOURNAL OF CHEMICAL PHYSICS | 1997年 / 106卷 / 21期
关键词
D O I
10.1063/1.473956
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have improved a newly developed experimental scheme for high resolution pulsed field ionization photoelectron (PFI-PE) studies [Hsu et al., Rev. Sci. Instrum. (in press)] using the high resolution monochromatized multibunch undulator synchrotron source of the Chemical Dynamics Beamline at the Advanced Light Source. This improved scheme makes possible PFI-PE measurements with essentially no contamination by background electrons arising from direct photoionization and prompt autoionization processes. We present here a preliminary analysis of the rotationally resolved PFI-PE spectrum for O-2 obtained at a resolution of 0.5 meV (full-width-at-half-maximum) in the photon energy range of 18.1-19.4 eV, yielding accurate ionization energies for the transitions O-2(+)(b (4) Sigma(g)(-), upsilon(+) = 0-9, N+ = 1) <-- O-2(X (3) Sigma(g)(-), upsilon = 0, N = 1). (C) 1997 American Institute of Physics.
引用
收藏
页码:8931 / 8934
页数:4
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