Creating a Stable Oxide at the Surface of Black Phosphorus

被引：322

作者：

Edmonds, M. T. ^{[1
,5
]}

Tadich, A. ^{[2
,5
]}

Carvalho, A. ^{[3
,4
]}

Ziletti, A. ^{[6
]}

O'Donnell, K. M. ^{[7
]}

Koenig, S. P. ^{[3
,4
]}

Coker, D. F. ^{[6
]}

Oezyilmaz, B. ^{[3
,4
]}

Castro Neto, A. H. ^{[3
,4
,8
]}

Fuhrer, M. S. ^{[1
,9
]}

机构：

[1] Monash Univ, Sch Phys & Astron, Clayton, Vic 3800, Australia

[2] Australian Synchrotron, Clayton, Vic 3183, Australia

[3] Natl Univ Singapore, Ctr Adv Mat 2D, Singapore 117546, Singapore

[4] Natl Univ Singapore, Graphene Res Ctr, Singapore 117546, Singapore

[5] Natl Univ Singapore, Dept Phys, Singapore 117546, Singapore

[6] Boston Univ, Dept Chem, Boston, MA 02215 USA

[7] Curtin Univ, Dept Imaging & Appl Phys, Bentley, WA 6102, Australia

[8] Boston Univ, Dept Phys, Boston, MA 02215 USA

[9] Univ Maryland, Ctr Nanophys & Adv Mat, College Pk, MD 20742 USA

来源：

ACS APPLIED MATERIALS & INTERFACES | 2015年 / 7卷 / 27期

基金：

新加坡国家研究基金会; 美国国家科学基金会;

关键词：

air stability; oxidation; black phosphorus; XPS; FIELD-EFFECT TRANSISTORS; VALENCE-BAND; PASSIVATION; ATMOSPHERE; SPECTRA;

D O I：

10.1021/acsami.5b01297

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The stability of the surface of in situ cleaved black phosphorus crystals upon exposure to atmosphere is investigated with synchrotron-based photoelectron spectroscopy. After 2 days atmosphere exposure a stable subnanometer layer of primarily P2O5 forms at the surface. The work function increases by 0.1 eV from 3.9 eV for as-cleaved black phosphorus to 4.0 eV after formation of the 0.4 nm thick oxide, with phosphorus core levels shifting by <0.1 eV. The results indicate minimal charge transfer, suggesting that the oxide layer is suitable for passivation or as an interface layer for further dielectric deposition.

引用

页码：14557 / 14562

页数：6

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