Electron diffraction studies of epitaxial C-60 thin films on mica(001)

被引：3
|
作者：
Lindner, JKN
Henke, S
Rauschenbach, B
Stritzker, B
机构：
[1] Universität Augsburg, Institut für Physik
来源：
THIN SOLID FILMS | 1996年 / 279卷 / 1-2期
关键词：
C-60; electron diffraction; mica;
D O I：
10.1016/0040-6090(95)08160-7
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
C-60 thin films were thermally evaporated onto mica(001) substrates at a temperature of 200 degrees C and a deposition rate of 0.5 Angstrom s(-1). The 2500 Angstrom thick films were studied using high-voltage transmission electron microscopy (HVTEM) and electron diffraction. Oriented growth of C-60 on mica with C-60(111)parallel to mica(001) was observed as well as twin formation about the three <[11(1)over bar ]> axes. The observed orientation relationships are discussed on the basis of structural considerations.
引用
收藏
页码：106 / 109
页数：4
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