Structural anisotropy in amorphous SnO2 film probed by X-ray absorption spectroscopy

被引：10

作者：

Zhu, Q. ^{[1
]}

Ma, Q. ^{[1
,2
]}

Buchholz, D. B. ^{[1
]}

Chang, R. P. H. ^{[1
]}

Bedzyk, M. J. ^{[1
]}

Mason, T. O. ^{[1
]}

机构：

[1] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA

[2] Argonne Natl Lab, Adv Photon Source, Northwestern Synchrotron Res Ctr, DND CAT, Argonne, IL 60439 USA

来源：

APPLIED PHYSICS LETTERS | 2013年 / 103卷 / 03期

基金：

美国国家科学基金会;

关键词：

FINE-STRUCTURE;

D O I：

10.1063/1.4815984

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Polarization-dependent X-ray absorption measurements reveal the existence of structural anisotropy in amorphous (a-) SnO2 film. The anisotropy is readily seen for the second neighbor interaction whose magnitude differs along three measured directions. The differences can be well accounted for by 10%-20% variation in the Debye-Waller factor. Instead of a single Gaussian distribution found in crystalline SnO2, the Sn-O bond distribution is bimodal in a-SnO2 whose separation shows a weak angular dependence. The oxygen vacancies, existing in the a-SnO2 film in the order of 10 21 cm(-3), distribute preferentially along the film surface direction. (C) 2013 AIP Publishing LLC.

引用

页数：4