In situ testing and X rays radiation effects of Pt/Bi3.15Nd0.85Ti3O12/Pt ferroelectric capacitors

被引：0
作者：
Li, Li [1 ]
机构：
[1] Xiangtan Univ, Minist Educ, Fac Mat Optoelect & Phys, Xiangtan, Peoples R China
来源：
ADVANCES IN MANUFACTURING SCIENCE AND ENGINEERING, PTS 1-4 | 2013年 / 712-715卷
关键词：
Ferroelectric; hysteresis curve; X-ray irradiation; total dose; IRRADIATION; DEGRADATION;
D O I：
10.4028/www.scientific.net/AMR.712-715.293
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Pt/Bi3.15Nd0.85Ti3O12(BNT)/Pt ferroelectric capacitors were monitored using in situ X-ray irradiation with 10 keV at BL14B1 beamline (Shanghai Synchrotron Radiation Facility). BL14B1 combined with a ferroelectric analyzer enabled measurements in situ of electrical performance. The hysteresis curve (P-E) of distortion depended on the polarization during irradiation, but the diffracted intensities of the (117) peak did not change in the beginning. The P-E curve had a negligible change from 2.09x10(9) Gy to 4.45 x 10(9) Gy. Finally, both Pr- and Pr+ very rapidly increased, but the intensities of (117) decreased. The hysteresis loops were remarkably deformed at the maximum total dose of 4.87x10(9) Gy.
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页码：293 / +
页数：3
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