Image quality and λFN/p for remote sensing systems

被引:117
作者
Fiete, RD [1 ]
机构
[1] Eastman Kodak Co, Commercial & Govt Syst, Rochester, NY 14653 USA
关键词
image quality; remote sensing; satellites; digital imaging; imaging systems;
D O I
10.1117/1.602169
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The ratio of the sampling frequency to the optical bandpass limit of an incoherent diffraction-limited optical system is a fundamental design parameter for digital imaging systems. This ratio is denoted by lambda FN/p, where lambda is the mean wavelength, FN is the system f/number, and p is the detector sampling pitch. The value of lambda FN/p for a remote sensing system can have a profound impact on the image quality and the utility of the acquired images. The interaction between lambda FN/p and image quality is sensitive to the system design parameters such as modulation transfer function (MTF), signal-to-noise ratio (SNR), and ground sampled distance (GSD). Image simulations and analysis are presented that illustrate the changes in image quality as a function of lambda FN/p. System design trades that may influence the determination of the optimal lambda FN/p for a remote sensing system are also discussed. (C) 1999 Society of Photo-Optical instrumentation Engineers. [S0091-3286(99)02107-8].
引用
收藏
页码:1229 / 1240
页数:12
相关论文
共 10 条
[1]  
[Anonymous], 1998, SAMPLING ALIASING DA
[2]  
Gaskill J.D., 1978, Linear Systems, Fourier Transforms, and Optics
[3]  
Goodman W., 2005, INTRO FOURIER OPTICS, V3rd
[4]   General Image-Quality Equation: GIQE [J].
Leachtenauer, JC ;
Malila, W ;
Irvine, J ;
Colburn, L ;
Salvaggio, N .
APPLIED OPTICS, 1997, 36 (32) :8322-8328
[5]  
LEACHTENAUER JC, 1996, ASPRS ASCM ANN CONV, V1, P262
[6]  
MONTAGUE G, 1997, SPACE COMMUN, V13, P3
[7]  
NELSON LJ, 1997, ADV IMAGING, V12, P61
[8]  
Schott JR., 2007, Remote sensing: the image chain approach
[9]  
Schroeder D. J., 1987, ASTRONOMICAL OPTICS
[10]   Understanding image quality losses due to smear in high-resolution remote sensing imaging systems [J].
Smith, SL ;
Mooney, J ;
Tantalo, TA ;
Fiete, RD .
OPTICAL ENGINEERING, 1999, 38 (05) :821-826