Interface Mixing in Fe/Si Multilayers Observed by the In Situ Conductance Measurements

被引：2

作者：

Chomiuk, P. ^{[1
]}

Blaszyk, M. ^{[1
]}

Szymanski, B. ^{[1
]}

Lucinski, T. ^{[1
]}

机构：

[1] Polish Acad Sci, Inst Mol Phys, PL-60179 Poznan, Poland

来源：

ACTA PHYSICA POLONICA A | 2009年 / 115卷 / 01期

关键词：

D O I：

10.12693/APhysPolA.115.355

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

In this contribution the in situ conductance vs. deposition time dependences of Fe/Si multilayers are analysed. The plot of resistance multiplied by the square of the thickness as a function of iron thickness shows that during the iron deposition initially amorphous-like Fe-Si mixture is formed, next the mixture crystallises, and finally bcc-Fe phase appears. The interface mixing is also manifested by the reduction of the total multilayer thickness measured by small angle. X-ray diffraction.

引用

页码：355 / 356

页数：2

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