New constraint for Vth optimization for sub 32nm node CMOS gates scaling

被引：0

作者：

Morifuji, E ^{[1
]}

Kapur, P ^{[1
]}

Chao, AKA ^{[1
]}

Nishi, Y ^{[1
]}

机构：

[1] Stanford Univ, Dept Elect Engn, Ctr Integrated Syst, Stanford, CA 94305 USA

来源：

IEEE INTERNATIONAL ELECTRON DEVICES MEETING 2005, TECHNICAL DIGEST | 2005年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

We show new constraint Of V-th scaling for logic blocks from inverter operation viewpoint. In lower V-th region, delay time in inverter chain saturates because of the loss in overdrive for the input of MOSFETs. This loss will dominate the inverter speed in scaled V-dd region and we propose a new relaxed scaling scenario. This accounts for the speed loss using a simplified model which adequately manifests the new phenomenon.

引用

页码：1049 / 1052

页数：4