共 19 条
- [4] Spectrally resolved white light interferometry to measure material dispersion over a wide spectral band in a single acquisition [J]. OPTICS EXPRESS, 2016, 24 (15): : 17303 - 17312
- [6] Wide band interferometry for thickness measurement [J]. OPTICS EXPRESS, 2003, 11 (08): : 952 - 957
- [9] Group delay dispersion measurements in the mid-infrared spectral range of 2-20 μm [J]. OPTICS EXPRESS, 2016, 24 (15): : 16705 - 16710
- [10] Refractive Index and Effective Thickness Measurement System for the RGB Color Filter Coatings With Absorption and Scattering Properties [J]. JOURNAL OF DISPLAY TECHNOLOGY, 2014, 10 (01): : 57 - 70