CALCULATION OF THE REFLECTION MATRIX IN THE PLANE WAVEGUIDE BY SCANNING SCREEN METHOD

被引：1

作者：

Aleksandrova, I. L. ^{[1
]}

Pleshchinskii, N. B. ^{[1
]}

机构：

[1] Kazan VI Lenin State Univ, Chebotarev Inst Math & Mech, Kazan 420111, Russia

来源：

2008 INTERNATIONAL CONFERENCE ON MATHEMATICAL METHODS IN ELECTROMAGNETIC THEORY | 2008年

关键词：

D O I：

10.1109/MMET.2008.4580927

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The possibility of calculation of coefficients of the reflection matrix partially describing inhomogeneous in the plane waveguide with metallic sides by bounded number of characteristics of the reflected field is studied. To receive the additional information it is proposed to use a thin conducting screen placed in front of the investigated heterogeneity.

引用

页码：170 / 172

页数：3