Design and Testing of Kinetic Inductance Detectors Made of Titanium Nitride

被引：17
作者：
Diener, P. [1 ]
Leduc, H. G. [2 ]
Yates, S. J. C. [1 ]
Lankwarden, Y. J. Y. [1 ]
Baselmans, J. J. A. [1 ]
机构：
[1] SRON Netherlands Inst Space Res, NL-3584 CA Utrecht, Netherlands
[2] CALTECH, Jet Prop Lab, Pasadena, CA USA
来源：
JOURNAL OF LOW TEMPERATURE PHYSICS | 2012年 / 167卷 / 3-4期
关键词：
Kinetic inductance detector; Superconducting microresonator; Titanium nitride; Microwave design; QUASI-PARTICLE;
D O I：
10.1007/s10909-012-0484-z
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
To use highly resistive material for Kinetic Inductance Detectors (KID), new designs have to be done, in part due to the impedance match needed between the KID chip and the whole 50 Omega readout circuit. Chips from two new hybrid designs, with an aluminum throughline coupled to titanium nitride microresonators, have been measured and compared to a TiN only chip. In the hybrid chips, parasitic temperature dependent box resonances are absent. The dark KID properties have been measured in a large set of resonators. A surprisingly long lifetime, up to 5.6 ms is observed in a few KIDs. For the other more reproducible devices, the mean electrical Noise Equivalent Power is 5.4 x 10(-19) W root Hz.
引用
收藏
页码：305 / 310
页数：6
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