Photoemission electron microscope for the study of magnetic materials

The design of a high resolution photoemission electron microscope (PEEM) for the study of magnetic materials is described. PEEM is based on imaging the photoemitted (secondary) electrons from a sample irradiated by x rays. This microscope is permanently installed at the Advanced Light Source at a bending magnet that delivers linearly polarized, and left and right circularly polarized radiation in the soft x-ray range. The microscope can utilize several contrast mechanisms to study the surface and subsurface properties of materials. A wide range of contrast mechanisms can be utilized with this instrument to form topographical, elemental, chemical, magnetic circular and linear dichroism, and polarization contrast high resolution images. The electron optical properties of the microscope are described, and some first results are presented. (C) 1999 American Institute of Physics. [S0034-6748(99)02910-X].