Simple Scanning Phase-Contrast X-ray Tomography Using Intensity Detectors

被引：3

作者：

Takano, Hidekazu ^{[1
]}

Shimomura, Sho ^{[1
]}

Konishi, Shigeki ^{[1
]}

Azuma, Hiroaki ^{[1
]}

Tsusaka, Yoshiyuki ^{[1
]}

Kagoshima, Yasushi ^{[1
]}

机构：

[1] Univ Hyogo, Grad Sch Mat Sci, Ctr Novel Mat Sci Multiextreme Condit, Kamigori, Hyogo 6781297, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 2013年 / 52卷 / 04期

关键词：

MICROSCOPE; RESOLUTION; INTERFEROMETRY;

D O I：

10.7567/JJAP.52.040204

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have developed a phase-contrast X-ray microtomography system based on scanning microscopy with X-ray focusing optics. The system is very simple because only two conventional intensity detectors and a half-obstructing-plate for the second detector are installed into the conventional scanning microscopy setup. We constructed the system with a 450-nm-size focused beam of a 10 keV X-ray. The system is operated with a sampling rate of 100 Hz. Adopting data correction using a guide object and data interpolation procedure in sinograms, tomographic reconstruction images with a high spatial resolution and phase sensitivity are obtained. (C) 2013 The Japan Society of Applied Physics

引用

页数：3

共 15 条

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