Simple Scanning Phase-Contrast X-ray Tomography Using Intensity Detectors

被引：3
作者：
Takano, Hidekazu [1 ]
Shimomura, Sho [1 ]
Konishi, Shigeki [1 ]
Azuma, Hiroaki [1 ]
Tsusaka, Yoshiyuki [1 ]
Kagoshima, Yasushi [1 ]
机构：
[1] Univ Hyogo, Grad Sch Mat Sci, Ctr Novel Mat Sci Multiextreme Condit, Kamigori, Hyogo 6781297, Japan
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 2013年 / 52卷 / 04期
关键词：
MICROSCOPE; RESOLUTION; INTERFEROMETRY;
D O I：
10.7567/JJAP.52.040204
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We have developed a phase-contrast X-ray microtomography system based on scanning microscopy with X-ray focusing optics. The system is very simple because only two conventional intensity detectors and a half-obstructing-plate for the second detector are installed into the conventional scanning microscopy setup. We constructed the system with a 450-nm-size focused beam of a 10 keV X-ray. The system is operated with a sampling rate of 100 Hz. Adopting data correction using a guide object and data interpolation procedure in sinograms, tomographic reconstruction images with a high spatial resolution and phase sensitivity are obtained. (C) 2013 The Japan Society of Applied Physics
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页数：3
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