Switching spectroscopy piezoresponse force microscopy of ferroelectric materials

被引：367

作者：

Jesse, S ^{[1
]}

Baddorf, AP ^{[1
]}

Kalinin, SV ^{[1
]}

机构：

[1] Oak Ridge Natl Lab, Condensed Matter Sci Div, Oak Ridge, TN 37831 USA

来源：

APPLIED PHYSICS LETTERS | 2006年 / 88卷 / 06期

关键词：

D O I：

10.1063/1.2172216

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The application of ferroelectric materials for electronic devices necessitates the quantitative study of local switching behavior, including imprint, coercive bias, remanent and saturation responses, and work of switching. Here we introduce switching spectroscopy piezoresponse force microscopy as a tool for real-space imaging of switching properties on the nanoscale. The hysteresis curves, acquired at each point in the image, are analyzed in the thermodynamic and kinetic limits. We expect that this approach will further understanding of the relationships between material microstructure and polarization switching phenomena on the nanoscale, and provide a quantitative tool for ferroelectric-based device characterization.

引用

页数：3

共 14 条

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