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How to achieve the best possible diffraction data? Editorial for Crystallography Reviews, Issue 1 of 2019
被引:1
作者
:
Bombicz, Petra
论文数:
0
引用数:
0
h-index:
0
机构:
Hungarian Acad Sci, Budapest, Hungary
Hungarian Acad Sci, Budapest, Hungary
Bombicz, Petra
[
1
]
机构
:
[1]
Hungarian Acad Sci, Budapest, Hungary
来源
:
CRYSTALLOGRAPHY REVIEWS
|
2019年
/ 25卷
/ 01期
关键词
:
D O I
:
10.1080/0889311X.2019.1574289
中图分类号
:
O7 [晶体学];
学科分类号
:
0702 ;
070205 ;
0703 ;
080501 ;
摘要
:
引用
收藏
页码:1 / 2
页数:2
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共 2 条
[1]
X-ray scattering characterisation of nanoparticles
[J].
Ingham, Bridget
论文数:
0
引用数:
0
h-index:
0
机构:
Callaghan Innovat, Lower Hutt 5040, New Zealand
Callaghan Innovat, Lower Hutt 5040, New Zealand
Ingham, Bridget
.
CRYSTALLOGRAPHY REVIEWS,
2015,
21
(04)
:229
-303
[2]
Ting Guo, 2018, CRYSTALLOGR REV, DOI [10.1080/0889311x.2018.1526173, DOI 10.1080/0889311X.2018.1526173]
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