Substrate Integrated Waveguide Cavity Resonators for Complex Permittivity Characterization of Materials

被引：106

作者：

Saeed, Kashif ^{[1
]}

Pollard, Roger D. ^{[1
]}

Hunter, Ian C. ^{[1
]}

机构：

[1] Univ Leeds, Inst Microwaves & Photon, Sch Elect & Elect Engn, Leeds LS2 9JT, W Yorkshire, England

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2008年 / 56卷 / 10期

关键词：

Cavity perturbation methods; microwave resonators; permittivity measurements;

D O I：

10.1109/TMTT.2008.2003523

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A novel planar substrate integrated waveguide cavity resonator technique for measurement of complex permittivity is described, which has applications for dielectric measurement systems in the pharmaceutical industry. The high-Q resonant structure is a modernization of well-known measurement cells where the dielectric constant is deduced by cavity perturbation from the shift in resonant frequency and the change in the Q factor. The method uses extremely small amounts of a broad range of materials for accurate characterization. The ease of fabrication, low cost, and potential for integration with many other components on the same substrate allows it to be used in a disposable manner.

引用

页码：2340 / 2347

页数：8

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