On Near-Field and Far-Field Correlations in Reverberation Chambers

被引：12
|
作者：
Chen, Xiaoming [1 ]
机构：
[1] Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Xian 710049, Peoples R China
来源：
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 2019年 / 29卷 / 01期
基金：
中国国家自然科学基金;
关键词：
Correlation; far field; near field; reverberation chamber (RC); TOTAL RADIATED POWER; PARAMETERS; ANTENNA; PATTERN;
D O I：
10.1109/LMWC.2018.2879786
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A common question for the reverberation chamber (RC) measurement is whether the Fraunhofer far-field distance is satisfied between the device under test and other objects (e.g., RC walls and mode stirrers). In this letter, it is shown that far-field sampling may not be needed for most RC measurements that rely on the statistics of the stirred field. For these kinds of measurements, measurement uncertainties in near field and far field are the same.
引用
收藏
页码：74 / 76
页数：3
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