Measuring and Imaging Permittivity of Insulators Using High-Frequency Eddy-Current Devices

被引:29
作者
Gaebler, Simone [1 ,2 ]
Heuer, Henning [2 ,3 ]
Heinrich, Gert [1 ,3 ]
机构
[1] Leibniz Inst Polymer Res Dresden, D-01069 Dresden, Germany
[2] Fraunhofer Inst Ceram Technol & Syst, D-01277 Dresden, Germany
[3] Tech Univ Dresden, D-01069 Dresden, Germany
关键词
Dielectric constant; dielectric losses; dielectric measurement; EC measurement; eddy currents (ECs); electromagnetic fields; electromagnetic induction; electromagnetic measurement; epoxy curing; epoxy resins; impedance measurement; insulators; nondestructive testing; parasitic capacitance; permittivity; polymers; EPOXY-RESIN CURE; STANDARD DEPTH; MICROWAVE; COMPOSITES; PENETRATION; ORIENTATION; INSPECTION; VISCOSITY; IMPEDANCE; POLYMERS;
D O I
10.1109/TIM.2015.2390851
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper shows that the high-frequency eddy-current (HFEC) measurement devices can be used not only for characterizing conductivity and magnetic permeability related properties of electrically conductive materials, but also for permittivity characterization of insulators. Maxwell's equations, finite-element method simulations, and experimental research are applied to support this hypothesis. An industrial HFEC device is used to measure the change of dielectric properties during the curing process of the epoxy resin L20. The measurement results are in good agreement with the expected behavior of the parameters relative permittivity and tan delta during cure. Using a capacitive reference device, similar characteristics regarding the change of the complex permittivity of the resin can be observed. In addition, HFEC imaging results on polymethyl methacrylate are presented, discussed, and compared with capacitive imaging. HFEC permittivity mapping benefits from a high spatial resolution with a sensitivity and penetration depth that is at least comparable with those of capacitive imaging technology.
引用
收藏
页码:2227 / 2238
页数:12
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