Comments on "Cryogenic noise parameter measurements of microwave devices"

被引：5
|
作者：
Wiatr, W [1 ]
机构：
[1] Warsaw Univ Technol, Inst Elect Syst, PL-00665 Warsaw, Poland
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2004年 / 53卷 / 02期
关键词：
D O I：
10.1109/TIM.2004.823649
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：619 / 619
页数：1
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