Dynamic parallel phase-shifting electronic speckle pattern interferometer

被引：5

作者：

Toto-Arellano, Noel-Ivan ^{[1
]}

Gomez-Mendez, Gustavo A. ^{[2
]}

Martinez-Garcia, Amalia ^{[2
]}

Otani, Yukitoshi ^{[3
]}

Serrano-Garcia, David, I ^{[4
]}

Antonio Rayas, Juan ^{[2
]}

Rodriguez-Zurita, Gustavo ^{[5
]}

Garcia-Lechuga, Luis ^{[1
]}

机构：

[1] Univ Tecnol Tulancingo, Cuerpo Acad Ingn Ciencias & Innovac Tecnol, Hgo 43645, Mexico

[2] Ctr Invest Opt AC, Leon 37150, Gto, Mexico

[3] Utsunomiya Univ, Ctr Opt Res & Educ, 7-1-2 Yoto, Utsunomiya, Tochigi 3218585, Japan

[4] Guadalajara Univ, Ctr Exact Sci & Engn CUCEI, Guadalajara, Jalisco, Mexico

[5] Benemerita Univ Autonoma Puebla, Fac Ciencias Fis Matemat, Puebla 72592, Pue, Mexico

来源：

APPLIED OPTICS | 2020年 / 59卷 / 27期

关键词：

SLOPE MEASUREMENT; LASER VIBROMETER; INPLANE; MODULATION; STRESS; ESPI; SHEAROGRAPHY; POLARIZATION; DISPLACEMENT; STRAIN;

D O I：

10.1364/AO.401309

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Methods for measuring variations in diffuse surfaces using electronic speckle pattern interferometry (ESPI) are widely used and well known. In this research, we present an out-of-plane ESPI system coupled to a Michelson configuration to generate simultaneous parallel interferograms with different phase shifts. The system uses circular polarization states to generate parallel phase shifted interferograms. Due to the polarization states, the fringes do not experience a contrast reduction, thus avoiding measurement errors that affect spatial or temporal phase-shifting in interferometry. The basic operating principle of polarization modulation is described, and results that represent the temporal evolution of an aluminum plate are presented. The generation of two simultaneous patterns allows one to track the dynamic performance of the plate. (C) 2020 Optical Society of America.

引用

页码：8160 / 8166

页数：7

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