A low-temperature dynamic mode scanning force microscope operating in high magnetic fields

被引：81
|
作者：
Rychen, J [1 ]
Ihn, T [1 ]
Studerus, P [1 ]
Herrmann, A [1 ]
Ensslin, K [1 ]
机构：
[1] ETH Honggerberg, Solid State Phys Lab, CH-8093 Zurich, Switzerland
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1999年 / 70卷 / 06期
关键词：
D O I：
10.1063/1.1149842
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A scanning force microscope was implemented operating at temperatures below 4.2 K and in magnetic fields up to 8 T. Piezoelectric quartz tuning forks were employed for nonoptical tip-sample distance control in the dynamic operation mode. Fast response was achieved by using a phase-locked loop for driving the mechanical oscillator. Possible applications of this setup for various scanning probe techniques are discussed. (C) 1999 American Institute of Physics. [S0034-6748(99)02206-6].
引用
收藏
页码：2765 / 2768
页数：4
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