Surface morphology of C60 polycrystalline films from physical vapor deposition

被引：15
作者：
Chen, RS [1 ]
Lin, YJ [1 ]
Su, YC [1 ]
Chiu, KC [1 ]
机构：
[1] Chung Yuan Christian Univ, Dept Phys, Chungli 32023, Taiwan
来源：
THIN SOLID FILMS | 2001年 / 396卷 / 1-2期
关键词：
surface morphology; fullerite films; PVD; growth mechanism;
D O I：
10.1016/S0040-6090(01)01256-1
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
C-60 polycrystalline films grown from physical vapor deposition are obtained. A surface morphology diagram in terms of the degree of supersaturation and the relative strength of bonding energy vs. thermal energy is determined from scanning electron microscopy, and discussed. The size of the grains in the high quality polycrystalline films is observed to depend sensitively on supersaturation and substrate temperature. X-Ray diffraction is applied, and the preferential orientations of these grains are in the (111), (220) and (311) directions. (C) 2001 Elsevier Science BY. All rights reserved.
引用
收藏
页码：103 / 108
页数：6
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