Design and characterization of a new fault-tolerant full-adder for quantum-dot cellular automata

被引：58
作者：
Farazkish, Razieh [1 ]
Khodaparast, Fatemeh [2 ]
机构：
[1] Islamic Azad Univ, Dept Comp Engn, South Tehran Branch, Tehran, Iran
[2] Islamic Azad Univ, Dept Comp Engn, Sci & Res Branch, Tehran, Iran
来源：
MICROPROCESSORS AND MICROSYSTEMS | 2015年 / 39卷 / 06期
关键词：
Quantum-dot cellular automata; Full-adder; Fault-tolerant circuits; Nanoelectronic circuits; Design and modeling;
D O I：
10.1016/j.micpro.2015.04.004
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A novel fault-tolerant full-adder for quantum-dot cellular automata is presented. Quantum-dot cellular automata (QCA) is an emerging technology and a possible alternative for semiconductor transistor based technologies. A novel fault-tolerant full-adder is proposed in this paper: This component is suitable for designing fault-tolerant QCA circuits. The redundant version of full-adder is simple in structure and more robust than the standard style for this device. By considering two-dimensional arrays of QCA cells, fault properties of such block full-adder can be analyzed in terms of misalignment, missing and dislocation cells. In order to verify the functionality of the proposed device, some physical proofs are provided. The results confirm our claims and its usefulness in designing digital circuits. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码：426 / 433
页数：8
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