electroluminescence;
transport measurements;
organic inorganic interfaces;
light sources;
D O I:
10.1016/S0379-6779(98)00840-6
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
We have fabricated a stable electrical interface between a range of n-type, p-type and undoped GaAs epitaxial layers and a film of conductive p-type polyaniline. The IV characteristics of this device show rectifying behaviour consistent with a potential barrier formed at the interface. We have used simple thermionic emission theory for a Schottky type barrier to model the results. This has shown no significant change in the barrier height as the fermi level moves through the semiconductor bandgap by changing from n-type to p-type substrates. We have measured the temperature dependence of the barrier height. Using n-type GaAs we can observe electroluminescence centred at 680 nm with a FWHM of 160 nn at a current density of 5 mA cm(-2). Our data suggests that the interface characteristics are controlled by surface states on the GaAs layer.