The impedance of ceramics with highly resistive grain boundaries: Validity and limits of the brick layer model

被引:140
作者
Fleig, J [1 ]
Maier, J [1 ]
机构
[1] Max Planck Inst Festkorperforsch, Stuttgart, Germany
关键词
brick layer model; grain boundaries; microstructure; impedance; electrical properties;
D O I
10.1016/S0955-2219(98)00298-2
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Impedance spectroscopy is an important tool to investigate the electrical properties of grain boundaries. For the analysis of the impedance spectra cubic grains, later ally homogeneous grain boundaries and identical properties of all grain boundaries are usually assumed (bricklayer model). However, in real ceramics these assumptions are generally violated. Using the finite element method we calculated the impedance of several polycrystals exhibiting highly resistive grain boundaries with microstructures and grain boundary properties deviating from the simple brick layer model. Detours around highly resistive regions (e.g. due to high grain boundary density or enhanced grain boundary resistivity) can play an important role and lead to grain-boundary semicircles depending on bulk properties and even to additional semicircles. Conditions are discussed within which the brick layer model allows for a reasonable evaluation of the spectra. (C) 1999 Elsevier Science Limited. All rights reserved.
引用
收藏
页码:693 / 696
页数:4
相关论文
共 17 条
[1]   STUDY OF SOLID ELECTROLYTE POLARIZATION BY A COMPLEX ADMITTANCE METHOD [J].
BAUERLE, JE .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1969, 30 (12) :2657-&
[2]   THE AC CONDUCTIVITY OF POLYCRYSTALLINE LISICON, LI2+2XZN1-XGEO4, AND A MODEL FOR INTERGRANULAR CONSTRICTION RESISTANCES [J].
BRUCE, PG ;
WEST, AR .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (03) :662-669
[3]  
EINZINGER R, 1981, ADV CERAM, V1, P359
[4]   The influence of laterally inhomogeneous contacts on the impedance of solid materials: A three-dimensional finite-element study [J].
Fleig, J ;
Maier, J .
JOURNAL OF ELECTROCERAMICS, 1997, 1 (01) :73-89
[5]   A finite element study on the grain boundary impedance of different microstructures [J].
Fleig, J ;
Maier, J .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1998, 145 (06) :2081-2089
[6]  
FLEIG J, UNPUB SOLID STATE IO
[7]  
FLEIG J, UNPUB FINITE ELEMENT
[8]  
FLEIG J, UNPUB J AM CERAM SOC
[9]   ELECTRICAL-PROPERTIES OF GRAIN-BOUNDARIES IN POLYCRYSTALLINE COMPOUND SEMICONDUCTORS [J].
GREUTER, F ;
BLATTER, G .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1990, 5 (02) :111-137
[10]  
KLEITZ M, 1981, ADV CERAM, V3, P310