X-ray photoelectron diffraction study of Cu(111): Multiple scattering investigation

被引：13
作者：
Despont, L
Naumovic, D
Clerc, F
Koitzsch, C
Garnier, MG
de Abajo, FJG
Van Hove, MA
Aebi, P
机构：
[1] Univ Neuchatel, Inst Phys, CH-2000 Neuchatel, Switzerland
[2] Univ Fribourg, Inst Phys, CH-1700 Fribourg, Switzerland
[3] UPV, EHU, CSIC, Ctr Mixto, San Sebastian 20080, Spain
[4] City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China
来源：
SURFACE SCIENCE | 2006年 / 600卷 / 02期
关键词：
photoelectron diffraction; multiple scattering; copper; electron solid interaction; scattering; diffraction;
D O I：
10.1016/j.susc.2005.10.038
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Multiple scattering theory based on a cluster model is used to simulate full-hemispherical X-ray photoelectron diffraction measurements in order to verify how state of the art multiple scattering simulations are able to reproduce the experiment. This approach is applied to the Cu(111) surface for two different photoelectron kinetic energies. Differences and similarities between single and multiple scattering are discussed in comparison with experimental results. We find that the present approach gives very good results despite some limitations. (c) 2005 Elsevier B.V. All rights reserved.
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收藏
页码：380 / 385
页数：6
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