Application of wavelet-fractal analysis approach on surface roughness research

被引：0

作者：

Xiong, F ^{[1
]}

Jiang, X ^{[1
]}

Li, Z ^{[1
]}

机构：

[1] Huazhong Univ Sci & Technol, Nano Technol Lab 2HU, Wuhan 430074, Peoples R China

来源：

COMPUTER-AIDED PRODUCTION ENGINEERING | 2001年

关键词：

surface roughness; wavelet; fractal; combination parameter;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A new approach based on the combination of wavelet-fractal theory for surface evaluation is proposed. The purpose is to provide a new way to represent characteristic of engineering surfaces. The result demonstrates that the combination parameter has some certain relationship with other existing evaluation parameters, and it can represent the characteristics of the engineering surface comprehensively.

引用

页码：373 / 376

页数：4

共 7 条

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[5] JIANG XQ, 1996, P ROYAL SOC CHAR 3 D
[6] Wornell G, 1996, Signal processing with fractals: a wavelet-based approach, DOI DOI 10.1121/1.424548
[7] XIONG F, 2001, ENG DESIGN, V26

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