Wettability of heterogeneous substrates

被引:0
|
作者
Voué, M
Bauthier, C
Vega, MJ
De Connick, J
机构
[1] Mat Nova, B-7000 Mons, Belgium
[2] Univ Mons, Ctr Rech Modelisat Mol, B-7000 Mons, Belgium
关键词
D O I
10.1002/1521-396X(200112)188:4<1345::AID-PSSA1345>3.0.CO;2-C
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Incomplete organic monolayers grafted on silicon wafer are characterized by spectroscopic ellipsometry (SE) using the Bruggeman effective-medium approximation. The formation of the monolayer, as a condensed liquid (LC*) phase, is investigated. The time evolution of the surface fractions occupied by the different phases allows the determination of a reaction model and of the associated thermodynamic constants. Furthermore, the high spacial resolution spectroscopic ellipsometry (HRSE) is used to study the spreading of silicon oils on such heterogeneous substrates. A simple model is proposed, in agreement with the experimental results, showing that the inverse of the diffusion coefficient of the liquid molecules is proportional to concentration of the heterogeneities.
引用
收藏
页码:1345 / 1351
页数:7
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